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Abstract This work focuses on the nature of magnetic anisotropy in 2.5–16 micron thick films of nickel ferrite (NFO) grown by liquid phase epitaxy (LPE). The technique, ideal for rapid growth of epitaxial oxide films, was utilized for films on (100) and (110) substrates of magnesium gallate (MGO). The motivation was to investigate the dependence of the growth induced anisotropy field on film thickness since submicron films of NFO were reported to show a very high anisotropy. The films grown at 850–875 C and subsequently annealed at 1000 C were found to be epitaxial, with the out-of-plane lattice constant showing unanticipated decrease with increasing film thickness and the estimated in-plane lattice constant increasing with the film thickness. The uniaxial anisotropy field H σ , estimated from X-ray diffraction data, ranged from 2.8–7.7 kOe with the films on (100) MGO having a higher H σ value than for the films on (110) MGO. Ferromagnetic resonance (FMR) measurements for in-plane and out-of-plane static magnetic field were utilized to determine both the magnetocrystalline the anisotropy field H 4 and the uniaxial anisotropy field H a . Values of H 4 range from −0.24 to −0.86 kOe. The uniaxial anisotropy field H a was an order of magnitude smaller than H σ and it decreased with increasing film thickness for NFO films on (100) MGO, but H a increased with film thickness for films on (110) MGO substrates. These observations indicate that the origin of the induced anisotropy could be attributed to several factors including (i) strain due to mismatch in the film-substrate lattice constants, (ii) possible variations in the bond lengths and bond angles in NFO during the growth process, and (iii) the strain arising from mismatch in the thermal expansion coefficients of the film and the substrate due to the high growth and annealing temperatures involved in the LPE technique. The LPE films of NFO on MGO substrates studied in this work are of interest for use in high frequency devices. 

Epitaxial thin films of cobalt ferrite (CoFe2O4) are grown on two isostructural substrates, (001)-oriented MgGa2O4 and ZnGa2O4, using pulsed laser deposition. The substrates have a lattice mismatch of 1.26% and 0.70% with bulk CoFe2O4 (CFO) crystal. We have systematically investigated the structural and magnetic properties of the epitaxial CFO films on these substrates. X-ray diffraction and transmission electron microscopy result analysis reveal that the films deposited on spinel ZnGa2O4 are essentially free of defects and are under a small compressive strain, while films on MgGa2O4 show partial strain relaxation along with defect formation. Room temperature magnetization data indicate that CFO grown on ZnGa2O4 substrates have a bulk-like saturation magnetization of 420 emu/cc and a uniaxial substrate-induced anisotropy value of −22.9× 106 erg/cm3 with an anisotropy field as low as 60 kOe.